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 FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
April 2008
FDFS2P753AZ
Integrated P-Channel PowerTrench MOSFET and Schottky Diode
-30V, -3A, 115m
Features
Max rDS(on) = 115m at VGS = -10V, ID = -3.0A Max rDS(on) = 180m at VGS = -4.5V, ID = -1.5A VF < 0.45V @ 2A VF < 0.28V @ 100mA Schottky and MOSFET incorporated into single power surface mount SO-8 package Electrically independent Schottky and MOSFET pinout for design flexibility RoHS Compliant
(R)
tm
General Description
The FDFS2P753AZ offers a single package solution for DC/DC conversion. It combines an excellent Fairchild's PowerTrench MOSFET with a Schottky diode in an SO-8 package. The MOSFET features a low on-state resistance and an optimized gate charge to achieve fast switching. The independently connected Schottky diode has a low forward voltage drop to minimize power loss. This device is an Ideal DC-DC solution for up to 3A peak load current.
Applications
DC - DC Conversion
D D C C D G S A A Pin 1 SO-8 C C 6 7 8 3 2 1 D 5 4 G S A A
MOSFET Maximum Ratings TA = 25C unless otherwise noted
Symbol VDS VGS ID Parameter Drain to Source Voltage Gate to Source Voltage Drain Current -Continuous -Pulsed PD EAS VRRM IO TJ, TSTG Power Dissipation Power Dissipation Single Pulse Avalanche Energy Schottky Repetitive Peak Reverse Voltage Schottky Average Forward Current Operating and Storage Junction Temperature Range TC = 25C TA = 25C (Note 1a) (Note 2) (Note 1a) Ratings -30 25 -3 -16 3.1 1.6 6 30 2 -55 to +150 Units V V A W mJ V A C
Thermal Characteristics
RJC RJA Thermal Resistance, Junction to Case Thermal Resistance, Junction to Ambient (Note 1) (Note 1a) 40 78 C/W
Package Marking and Ordering Information
Device Marking FDFS2P753AZ Device FDFS2P753AZ Package SO-8 Reel Size 330mm Tape Width 12mm Quantity 2500units
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
1
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
Electrical Characteristics TJ = 25C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BVDSS BVDSS TJ IDSS IGSS Drain to Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate to Source Leakage Current ID = -250A, VGS = 0V ID = -250A, referenced to 25C VDS = -24V, VGS = 0V TJ = 125C VGS = 25V, VDS = 0V -30 -21 -1 -100 10 V mV/C A A
On Characteristics
VGS(th) VGS(th) TJ rDS(on) gFS Gate to Source Threshold Voltage Gate to Source Threshold Voltage Temperature Coefficient Static Drain to Source On Resistance Forward Transconductance VGS = VDS, ID = -250A ID = -250A, referenced to 25C VGS = -10V, ID = -3.0A VGS = -4.5V, ID = -1.5A VGS = -10V, ID = -3.0A, TJ = 125C VDD = -5V, ID = -3.0A -1.0 -2.1 5 69 115 97 6 115 180 162 S m -3.0 V mV/C
Dynamic Characteristics
Ciss Coss Crss Rg Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance VDS = -15V, VGS = 0V, f = 1MHz f = 1MHz 330 60 55 18 455 110 100 pF pF pF
Switching Characteristics
td(on) tr td(off) tf Qg Qg Qgs Qgd Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Total Gate Charge Gate to Source Charge Gate to Drain "Miller" Charge VGS = 0V to -10V VGS = 0V to -4.5V VDD = -15V, ID = -3.0A VDD = -15V, ID = -3.0A, VGS = -10V, RGEN = 6 6 4 19 15 7.9 4.1 1.3 2.0 12 10 34 27 11.0 5.7 ns ns ns ns nC nC nC nC
Drain-Source Diode Characteristics
VSD trr Qrr Source to Drain Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, IS = -2.0A IF = -3.0A, di/dt = 100A/s (Note 3) -0.9 20 14 -1.2 30 21 V ns nC
Schottky Diode Characteristics
VR IR Reverse Breakdown Voltage Reverse Leakage IR = 1mA VR = 10V IF = 100mA VF Forward Voltage IF = 2A TJ = 25C TJ = 125C TJ = 25C TJ = 125C TJ = 25C TJ = 125C 30 39 18 225 140 364 290 450 280 mV 250 V A mA
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
2
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
NOTES: 1.RJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RJC is guaranteed by design while RCA is determined by the user's board design.
a. 78C/W when mounted on a 0.5 in2 pad of 2 oz copper.
b. 135C/W when mounted on a minimum pad of 2 oz copper.
2. Starting TJ = 25C, L = 3 mH, IAS = -2A, VDD = -27V, VGS = -10V. 3. Pulse Test: Pulse Width < 300s, Duty cycle < 2.0%.
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
3
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
Typical Characteristics TJ = 25C unless otherwise noted
16
NORMALIZED DRAIN TO SOURCE ON-RESISTANCE VGS = -10V -ID, DRAIN CURRENT (A) VGS = -5V
3.0 2.5 2.0 1.5
VGS = -4.5XV VGS = -5V VGS = -3.5V PULSE DURATION = 80s DUTY CYCLE = 0.5%MAX VGS = -4V
12
VGS = -4.5V
8
VGS = - 4V VGS = -3.5V
4
PULSE DURATION = 80s DUTY CYCLE = 0.5%MAX
1.0
VGS = -10V
0 0
0.5 0 4 8 12 16
-ID, DRAIN CURRENT(A)
1
2
3
4
5
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 1. On-Region Characteristics
Figure 2. Normalized On-Resistance vs Drain Current and Gate Voltage
400
SOURCE ON-RESISTANCE (m)
1.6
NORMALIZED DRAIN TO SOURCE ON-RESISTANCE ID = -3A VGS = -10V
350 300 250 200
PULSE DURATION = 80s DUTY CYCLE = 0.5%MAX
1.4 1.2 1.0 0.8 0.6 -75
rDS(on), DRAIN TO
ID = -1.5A
TJ = 150oC
150 100 50
TJ = 25oC
-50
-25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (oC)
2
4
6
8
10
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. Normalized On- Resistance vs Junction Temperature
16
-IS, REVERSE DRAIN CURRENT (A)
PULSE DURATION = 80s DUTY CYCLE = 0.5%MAX
Figure 4. On-Resistance vs Gate to Source Voltage
20 10
VGS = 0V
-ID, DRAIN CURRENT (A)
12
VDD = -5V
1
TJ = 150oC TJ = 25oC
8
TJ = 25oC
0.1
4
TJ = 150oC TJ = -55oC
0.01
TJ = -55oC
0
0
1
2
3
4
5
6
0.001 0.2
0.4
0.6
0.8
1.0
1.2
-VGS, GATE TO SOURCE VOLTAGE (V)
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure 6. Source to Drain Diode Forward Voltage vs Source Current
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
4
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
Typical Characteristics TJ = 25C unless otherwise noted
10
-VGS, GATE TO SOURCE VOLTAGE(V) ID = -3A
1000
Ciss
VDD = -10V VDD = -20V CAPACITANCE (pF)
8 6
VDD = -15V
4 2 0 0 2 4 6 8 10
Qg, GATE CHARGE(nC)
Coss
100
f = 1MHz VGS = 0V
Crss
30 0.1
1
10
30
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Gate Charge Characteristics
Figure 8. Capacitance vs Drain to Source Voltage
10
-Ig, GATE LEAKAGE CURRENT(A)
-4
5
-IAS, AVALANCHE CURRENT(A)
4 3
TJ = 25oC
10
-5
10
-6
TJ = 125oC
2
TJ = 125oC
10
-7
TJ = 25oC
1 0.01
10
-8
0.1
tAV, TIME IN AVALANCHE(ms)
1
2
0
5
10
15
20
25
30
-VGS, GATE TO SOURCE VOLTAGE(V)
Figure 9. Unclamped Inductive Switching Capability
3.0
-ID, DRAIN CURRENT (A)
Figure 10. Gate Leakage Current vs Gate to Source Volatge
20 10
VGS = -10V
2.0 1.5 1.0 0.5
RJA = 78 C/W
o
-ID, DRAIN CURRENT (A)
2.5
1ms
1
THIS AREA IS LIMITED BY rDS(on)
10ms 100ms 1s 10s DC
VGS = -4.5V
0.1
SINGLE PULSE TJ = MAX RATED RJA = 135oC/W TA = 25oC
0.0 25
50
75
100
125
o
150
0.01 0.1
1
10
80
TA, AMBIENT TEMPERATURE ( C)
-VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 11. Maximum Continuous Drain Current vs Ambient Temperature
Figure 12. Forward Bias Safe Operating Area
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
5
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
Typical Characteristics TJ = 25C unless otherwise noted
IR, REVERSE LEAKAGE CURRENT (mA)
100
IF, FORWARD CURRENT(A)
100
TJ = 125oC
10
TJ = 125oC
10
1 0.1 0.01 0.001 0.0
1
TJ =
25oC
0.1
TJ = 25oC
0.01 0 5 10 15 20 25 30
VR, REVERSE VOLTAGE (V)
0.2
0.4
0.6
0.8
1.0
1.2
VF, FORWARD VOLTAGE(V)
Figure 13. Schottky Diode Forward Voltage
50
P(PK), PEAK TRANSIENT POWER (W)
Figure 14. Schottky Diode Reverse Current
VGS = -10V
10
SINGLE PULSE RJA = 135 C/W TA = 25 C
o o
1
0.5 -3 10
10
-2
10
-1
10
0
10
1
10
2
10
3
t, PULSE WIDTH (s)
Figure 15. Single Pulse Maximum Power Dissipation
2
1
NORMALIZED THERMAL IMPEDANCE, ZJA
DUTY CYCLE-DESCENDING ORDER
D = 0.5 0.2 0.1 0.05 0.02 0.01
PDM
0.1
t1 t2
SINGLE PULSE RJA = 135 C/W
o
NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZJA x RJA + TA
0.01 -3 10
10
-2
10
-1
10
0
10
1
10
2
10
3
t, RECTANGULAR PULSE DURATION (s)
Figure 16. Transient Thermal Response Curve
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
6
www.fairchildsemi.com
FDFS2P753AZ Integrated P-Channel PowerTrench(R) MOSFET and Schottky Diode
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidianries, and is not intended to be an exhaustive list of all such trademarks. ACEx(R) Build it NowTM CorePLUSTM CorePOWERTM CROSSVOLTTM CTLTM Current Transfer LogicTM EcoSPARK(R) EfficentMaxTM EZSWITCHTM *
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tm
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PDP-SPMTM Power-SPMTM PowerTrench(R) Programmable Active DroopTM QFET(R) QSTM Quiet SeriesTM RapidConfigureTM Saving our world 1mW at a timeTM SmartMaxTM SMART STARTTM SPM(R) STEALTHTM SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SuperMOSTM (R)
The Power Franchise(R)
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UHC(R) Ultra FRFETTM UniFETTM VCXTM VisualMaxTM
* EZSWITCHTM and FlashWriter(R) are trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD'S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. This datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
Rev. I34
Preliminary
First Production
No Identification Needed Obsolete
Full Production Not In Production
(c)2008 Fairchild Semiconductor Corporation FDFS2P753AZ Rev.C
www.fairchildsemi.com


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